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QICID: 20671
Title: Extreme (X-) Testing With Binary Data and Applications to Reliability Demonstration
Copyright: 2006, ASA/ASQ
Author: Mease, David; Nair, Vijayan N.
Organization: San Jose State University, San Jose, CA; University of Michigan, Ann Arbor, MI
Subject: Destructive testing,Failure analysis,Life testing,Product quality,Reliability,Sample size,Testing;
Series: Technometrics, Vol. 48, No. 3, August 2006, pp. 399-410
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Abstract: [This abstract is based on the authors' abstract.]When a specified reliability target is very high, traditional reliability demonstration techniques require very large sample sizes or have low power. This problem can be addressed by inflating the failure probability by testing under extreme conditions, increasing the likelihood of product failure. Results can then be mapped back to reliability under standard conditions. A framework is developed for this type of extreme testing, or X-testing, with binary data. Effects of X-testing on sample size and the power of reliability demonstration plans are discussed. Properties of various X-transforms are studied, and conditions under which they lead to inadmissible or uniformly efficient tests are obtained. Several applications demonstrate the usefulness of the approach.
Number of pages: 12
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