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QICID: 14402
Title: Closed-Loop Defect Removal Model Using Statistical Process Control
Copyright: 2000, Achamma Jose; N. K. Anju; S. K. Pillai
Author: Jose, Achamma; Anju, N. K.; Pillai, S. K.
Organization: Network Systems and Technologies (P) Ltd.
Subject: Prediction,Defects,Quality management (QM),Testing,Statistical process control (SPC),Software quality;
Series: Software Quality Professional, Vol. 3, No. 1, December 2000, pp. 39-47
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Abstract: Although this article may not be purchased individually through the Quality Information Center, the entire issue of which it is a part may be purchased through ASQ's Customer Service Center at (800) 248-1946. Please request Software Quality Professional, Volume 3, Issue 1. Members $12, Nonmembers $17. [This abstract is based on the editor's abstract. A longer abstract is available on the journal's website.] A closed-loop defect removal model is introduced that is used for software quality management and defect prediction. The model addresses injected defects and escaped defects separately. Using statistical process control, specification limits are fixed for predicted values of defects, estimates are revised, causes of defects are analyzed, and preventative/corrective actions are taken. The result is better quality planning, control, and management.
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