Chris Grachanen

Chris began his metrology career as a USAF PMEL technician. Following a six-year enlistment, Chris went to work for the U.S. Navy calibration laboratories in Alaska and Bermuda, then NASA calibration laboratories at John Glenn Research Center and Kennedy Space Center (KSC). Upon leaving KSC, Chris worked for Digital Equipment Corp. (DEC) Metrology laboratory in Massachusetts. After leaving DEC, Chris went to work for Compaq Computer in the Corporate Metrology laboratory, now known as the Hewlett-Packard Company, Houston Metrology Group (Chris manages the group).

Chris is the American Society for Quality (ASQ) Measurement Quality Division (MQD) Certified Calibration Technician (CCT) chairman, an editorial advisor for the International Journal of Metrology (Cal Lab Magazine), the National Conference of Standards Laboratories International (NCSLI) South Central US Regional coordinator and is a technical advisor for the National Association for Proficiency Testing (NAPT).

Chris is the author of three metrology based software packages used by measurement professionals throughout the world and has authored scores of articles for metrology / measurement publications. Chris is a co-author of ASQ's Metrology Handbook and was profiled in ASQ's Quality Progress magazine, 'The Face of Quality', May 2004. Chris has been awarded the following:

• 1998 Dr. Allan V. Astin award for best conference paper (NCSLI)
• 2002 Max J. Unis Award by ASQ Measurement Quality Division
• 2003 Excellence Award by ASQ Certification Board
• 2004 Test Engineer of Year by Test & Measurement World (T&MW) magazine

Chris holds a B.S. in Technology and Management from the Univ. of Maryland, a B.S. in Electronics Engineering from the Cooks Institute of Electronics Engineering and a MBA from Regis University.